Proposed non- destructive optic defectoscopy methods for polymer films: structural light, geometric moiré, speckle, photoelastic. A thin film defect has been analyzed. The eigenmodes are obtained when the surface of the films is defective and without defects. The stresses of defective films have been determined. Recommendations are made for controlling the non – destructive physical properties of the film during the manufacturing process.
Together with USA researches, five articles were printed in international journals. Recommendations are made for controlling the non-destructive physical properties of the film during the manufacturing process.
Project coordinator: Kaunas University of Technology