A. Merfeldas “Development and investigation of near-field radiated susceptibility mapping methodology for radio frequency devices” doctoral dissertation defence

Thesis Defense

Author, Institution: Audrius Merfeldas, Kaunas University of Technology

Science area, field of science: Technological Sciences, Electrical and Electronics Engineering, T001

Scientific supervisor: Prof. Dr. Darius Gailius (Kaunas University of Technology, Technological Sciences, Electrical and Electronics Engineering, T001)

Dissertation Defence Board of Electrical and Electronics Engineering Science Field:
Prof. Dr. Liudas Mažeika (Kaunas University of Technology, Technological Sciences, Electrical and Electronic Engineering, T001) – chairman
Prof. Dr. Elena Jasiūnienė (Kaunas University of Technology, Technological Sciences, Electrical and Electronic Engineering, T001)
Prof. Dr. Wlodek J. Kulesza (Blekinge Institute of Technology, Sweden, Technological Sciences, Electrical and Electronic Engineering, T001)
Prof. Dr. Jurij Novickij (Vilnius Gediminas Technical University, Technological Sciences, Electrical and Electronic Engineering, T001)
Prof. Dr. Darius Viržonis (Kaunas University of Technology, Technological Sciences, Electrical and Electronic Engineering, T001)

The dissertation defence takes place online.

The doctoral dissertation is available at the library of Kaunas University of Technology (K. Donelaičio g. 20, Kaunas).

Annotation:

Radiated susceptibility is mandatory test for both successful electromagnetic compatibility (EMC) tests and product certification procedures. It also reflects the quality of the electronics design and technical solutions to ensure product shows no degradation of performance by presence of any electromagnetic (EM) signals, noises and interferences. This is very important for medical, automotive, aviation and military applications where electronic devices might suffer from high level EM interferences and device operation is related to critical safety. Though high precision and repeatability far-field testing methods often preferred by the full-compliance laboratories, they are lacking of information and often limited to “Pass/Fail” type of results.

The proposed improved spatial resolution magnetic near-field probe, the adaptive scanning height methodology and the instruments enables radiated susceptibility mapping and hotspot localization of radio frequency printed circuit boards (PCBs). The detailed analysis of the common electronics components, the PCB layout and the scanning height influence for the -6dB magnetic field aperture size and shape was determined.

The developed methodology allows RF susceptibility mapping and hotspot localization for high integration RF devices that might contribute as a helpful tool for troubleshooting and analysis for EMC laboratories.

 

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